Noncontact Atomic Force Microscopy - E-book

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Noncontact Atomic Force Microscopy - ENG

Seizo Morita; Roland Wiesendanger; E. Meyer

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Sinopsis

ISBN:	9783642560194
Formato:	Page Fidelity
Idioma:	Inglés
Editorial:	Springer Nature
Tema:	Tecnología e ingeniería
Subtema:	Nanotecnología y Sistemas Microelectromecánicos (MEMS)
Año de publicación:	2012-12-06

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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