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Microwave Imaging - ENG

$2,440.00
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ISBN: 9780470602478
Formato: Page Fidelity
Idioma: Inglés
Editorial: Wiley Global Research (STMS)
Tema: Tecnología e ingeniería
Subtema: Sistema de Imagen
Año de publicación: 20100427

An introduction to the most relevant theoretical and algorithmic aspects of modern microwave imaging approaches Microwave imaging—a technique used in sensing a given scene by means of interrogating microwaves—has recently proven its usefulness in providing excellent diagnostic capabilities in several areas, including civil and industrial engineering, nondestructive testing and evaluation, geophysical prospecting, and biomedical engineering. Microwave Imaging offers comprehensive descriptions of the most important techniques so far proposed for short-range microwave imaging—including reconstruction procedures and imaging systems and apparatus—enabling the reader to use microwaves for diagnostic purposes in a wide range of applications. This hands-on resource features: A review of the electromagnetic inverse scattering problem formulation, written from an engineering perspective and with notations The most effective reconstruction techniques based on diffracted waves, including time- and frequency-domain methods, as well as deterministic and stochastic space-domain procedures Currently proposed imaging apparatus, aimed at fast and accurate measurements of the scattered field data Insight on near field probes, microwave axial tomographs, and microwave cameras and scanners A discussion of practical applications with detailed descriptions and discussions of several specific examples (e.g., materials evaluation, crack detection, inspection of civil and industrial structures, subsurface detection, and medical applications) A look at emerging techniques and future trends Microwave Imaging is a practical resource for engineers, scientists, researchers, and professors in the fields of civil and industrial engineering, nondestructive testing and evaluation, geophysical prospecting, and biomedical engineering.

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