Field Emission Scanning Electron Mi - E-book

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Field Emission Scanning Electron Microscopy - ENG

New Perspectives For Materials Characterization

Nicolas Brodusch; Hendrix Demers; Raynald Gauvin

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Sinopsis

ISBN:	9789811044335
Formato:	Page Fidelity
Idioma:	Inglés
Editorial:	Springer Nature
Tema:	Tecnología e ingeniería
Subtema:	Ciencia de los Materiales general
Año de publicación:	2017-09-25

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

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